General Specifications
Instrument Type
Energy dispersive X-ray measuring instrument (EDXRF) to determine thin coatings, trace elements and alloys.
Element Range
Aluminium (13) to Uranium (92). With up to 24 elements simultaneously.
Design
Bench top unit with upwards opening hood.
Measurement Direction
From Bottom to Top
X-Ray Source
X-ray Tube
Micro Focus tube with tungsten target and beryllium window
High Voltage
Stepped High Voltage Power 5 kV – 50 kV
0-50 kV Spellman (USA)
0-50 kV Spellman (USA)
Tube Flow
Smooth Tube Flow of 0 μA – 1000 μA
Aperture
Fixed 0.8mm Ø Collimator
Multi Collimator Optional with Software optimization for
0.8mm Ø, 1.2mm Ø, 2mm Ø Collimators
Multi Collimator Optional with Software optimization for
0.8mm Ø, 1.2mm Ø, 2mm Ø Collimators
X-Ray Detection
X-ray Detector
Modern Ametek Make Detectors with Peltier Cool Technology
Resolution
≤ 160 eV
Optional
Silicon Pin Detectors / Silicon Drift Detectors
Sample Stage
Design
Fixed sample support
Sample Placement Area
328*388*98 mm
Sample Positioning
Manually with the help of High Resolution CCD color camera for optical monitoring of the measurement location along the primary beam axis.
Crosshairs with Calibrated scale & Spot indicator with LED illumination.
Crosshairs with Calibrated scale & Spot indicator with LED illumination.
Sample Weight
15 Kgs
Sample Height
90mm (3.5″)
Electrical Data
Power Supply
AC 115 V or AC 230 V | 50/60 Hz
Power Consumption
Max. 120 W without PC
Dimension of Instrument
External Dimensions
Width × Depth × Height (mm): 416 × 414 × 362
Weight
28 Kgs
Environmental Conditions
Ambient Temperature
15°C – 30°C
Relative Humidity
35% – 70%, non-condensing
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